An edition of New Approaches To Image Processing Based Failure Analysis Of Nanoscale Ulsi Devices (2013)

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices

By Eran Gur

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Publish Date

2013

Publisher

Elsevier Science & Technology Books

Language

eng

Pages

110

Description:

subjects: Image processing, Integrated circuits, ultra large scale integration, Nanotechnology, Computers and IT, Ultra large scale integration, Nanoelectronics, Testing, Microelectronics, Integrated circuits