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integrated circuits ultra large scale integration

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View Advanced interconnects for ULSI technology By Mikhail Baklanov,P. S. Ho,Ehrenfried Zschech
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Advanced interconnects for ULSI technology

By Mikhail Baklanov,P. S. Ho,Ehrenfried Zschech

View Selected Topics in Power, RF, and Mixed-Signal ICs By Yan Lu,Chi-Seng Lam
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Selected Topics in Power, RF, and Mixed-Signal ICs

By Yan Lu,Chi-Seng Lam

View Crystal Growth and Evaluation of Silicon for VLSI and ULSI By Golla Eranna
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Crystal Growth and Evaluation of Silicon for VLSI and ULSI

By Golla Eranna

View Terrestrial Radiation Effects in ULSI Devices and Electronic Systems By Eishi H. Ibe

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

By Eishi H. Ibe

View Group IV Semiconductor Nanostructures: 2006 By Leonid Tsybeskov
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Group IV Semiconductor Nanostructures: 2006

By Leonid Tsybeskov

View CMOS/BiCMOS ULSI By Kiat Seng Yeo
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CMOS/BiCMOS ULSI

By Kiat Seng Yeo

View Electromigration in Ulsi Interconnections By Cher Ming Tan

Electromigration in Ulsi Interconnections

Electromigration in Ulsi Interconnections

By Cher Ming Tan

View Chemical vapor deposition of tungsten and tungsten silicides for VLSI/ULSI applications By John E. J. Schmitz
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Chemical vapor deposition of tungsten and tungsten silicides for VLSI/ULSI applications

By John E. J. Schmitz

View Advanced metallization and interconnect systems for ULSI applications in 1995 By Shi-Qing Wang
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Advanced metallization and interconnect systems for ULSI applications in 1995

By Shi-Qing Wang

View ULSI semiconductor technology atlas By Chih-Hang Tung,George T. T. Sheng,Chih-Yuan Lu
Cover of ULSI semiconductor technology atlas by chih-hang tung,george t. t. sheng,chih-yuan lu

ULSI semiconductor technology atlas

By Chih-Hang Tung,George T. T. Sheng,Chih-Yuan Lu

View Gate stack and silicide issues in silicon processing By Symposium on Gate Stack and Silicide Issues in Silicon Processing (2000 San Francisco, CA)
Cover of Gate stack and silicide issues in silicon processing by symposium on gate stack and silicide issues in silicon processing (2000 san francisco, ca)

Gate stack and silicide issues in silicon processing

By Symposium on Gate Stack and Silicide Issues in Silicon Processing (2000 San Francisco, CA)

View New Approaches To Image Processing Based Failure Analysis Of Nanoscale Ulsi Devices By Eran Gur
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New Approaches To Image Processing Based Failure Analysis Of Nanoscale Ulsi Devices

By Eran Gur

View Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford By Moore
Cover of Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT  Workshop on Designing for Yield, 1-3 July 1987, Oxford by moore

Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford

By Moore

View IC interconnect analysis By Mustafa Celik
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IC interconnect analysis

By Mustafa Celik

View Zinc Oxide and Related Materials By Juergen Christen
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Zinc Oxide and Related Materials

By Juergen Christen

View ULSI Front-End Technology By Wai Shing Lau

ULSI Front-End Technology

ULSI Front-End Technology

By Wai Shing Lau

View Tungsten and Other Advanced Metals for Ulsi Applications in 1990 By G. C. Smith

Tungsten and Other Advanced Metals for Ulsi Applications in 1990

Tungsten and Other Advanced Metals for Ulsi Applications in 1990

By G. C. Smith

View Sub-Half-Micron Lithography for ULSIs By Katsumi Suzuki,Shinji Matsui
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Sub-Half-Micron Lithography for ULSIs

By Katsumi Suzuki,Shinji Matsui

View Advanced Metallization Conference 2005 (AMC 2005) By Advanced Metallization Conference (2005 Colorado Springs, Colo. and Tokyo, Japan)
Cover of Advanced Metallization Conference 2005 (AMC 2005) by advanced metallization conference (2005 colorado springs, colo. and tokyo, japan)

Advanced Metallization Conference 2005 (AMC 2005)

By Advanced Metallization Conference (2005 Colorado Springs, Colo. and Tokyo, Japan)

View Integrated circuit design By Patmos 2000 (2000 Göttingen, Germany)

Integrated circuit design

Integrated circuit design

By Patmos 2000 (2000 Göttingen, Germany)

View Solutions Manual for ULSI Devices By C.Y. Chang,S. Sze
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Solutions Manual for ULSI Devices

By C.Y. Chang,S. Sze

View ULSI Semiconductor Technology Atlas By C. Tung

ULSI Semiconductor Technology Atlas

ULSI Semiconductor Technology Atlas

By C. Tung

View ULSI devices By C. Y. Chang,S. M. Sze
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ULSI devices

By C. Y. Chang,S. M. Sze

View Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections By Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou
Cover of Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by cher ming tan,wei li,zhenghao gan,yuejin hou

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

By Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou