An edition of 1998 IEEE International Integrated Reliability Workshop final report (1998)
1998 IEEE International Integrated Reliability Workshop final report
Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
By International Integrated Reliability Workshop (1998 Lake Tahoe, Calif.),IEEE Reliability Society,Institute of Electrical and Electronics Engineers,IEEE Electron Devices Society,Ieee Reliability Society
Publish Date
1998
Publisher
IEEE Electron Devices Society,IEEE Reliability Society
Language
eng
Pages
140
Description:
subjects: Reliability, Congresses, Integrated circuits, Wafer-scale integration, Circuits & components, Reliability engineering, c 1990 to c 2000, Technology & Industrial Arts, Engineering - Electrical & Electronic, Technology, Science/Mathematics, Electronics - Circuits - General, Electronics - Microelectronics