Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques

An edition of Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques (1979)

Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.

By George G. Harman

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Publish Date

1979

Publisher

U.S. Government Printing Office

Language

eng

Pages

Description:

subjects: Acoustic emission testing, Semiconductor industry, Nondestructive testing, Semiconductors, Testing, Quality control, Acoustic emission