Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques

An edition of Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques (1979)

Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques

By George G. Harman

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Publish Date

1979

Publisher

U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.

Language

eng

Pages

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