Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques
An edition of Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques (1979)
By George G. Harman
Publish Date
1979
Publisher
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Language
eng
Pages
66
1-2 of 2 Editions
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.
Language: eng
Published In: 1979
Publisher: U.S. Government Printing Office
Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques
Language: eng
Pages: 66
Published In: 1979
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.