An edition of IWSM (1998)
IWSM: 1998 3rd International Workshop on Statistical Metrology
June 7, 1998, Honolulu
By International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii),IEEE Electron Devices Society,Institute of Electrical and Electronics Engineers
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Publish Date
1998
Publisher
Widerkehr and Associates
Language
eng
Pages
121
Description:
subjects: Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Engineering measurement & calibration, Mathematics for scientists & engineers, Technology & Industrial Arts, Engineering Statistics, Very-Large-Scale Integration (Vlsi), Technology, Science/Mathematics, Electronics - Semiconductors, Mensuration, Reference