

An edition of Physical principles of electron microscopy (2005)
an introduction to TEM, SEM, and AEM
By R. F. Egerton
Publish Date
2005
Publisher
Springer Science+Business Media
Language
eng
Pages
199
Description:
"Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy, for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy."--BOOK JACKET
subjects: Electron microscopy, Materials, Microscopy, Electron microscopes, Electron Microscopy, Physics, Microscopie électronique, Microscopy, electron, Qh212.e4 e354 2007, 502, Materials science, Spectroscopy & spectrum analysis, General, Nanotechnology & mems, Trades & technology -> industrial technology -> materials science, Physical & earth sciences -> physics -> general, Biological sciences & nutrition -> biology -> life sciences general, Trades & technology -> technology & engineering -> nanotechnology & mems, Scz17000, Scp31090, Scl26000, Scz14000, Suco11644, 4741, 2951, 2874, 3460