

An edition of 1996 International Integrated Reliability Workshop final report (1996)
Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996
By International Integrated Reliability Workshop (1996 Lake Tahoe, California),Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe,California) International Integrated Reliability Workshop (1996 : Lake Tahoe
Publish Date
1996
Publisher
IEEE Electron Devices Society,IEEE Reliability Society
Language
eng
Pages
175
Description:
subjects: Congresses, Reliability, Integrated circuits, Wafer scale integration, Electronic devices & materials, Reliability Engineering, Technology, Microelectronics, Education / Teaching, Science/Mathematics, Electronics - Circuits - General, General, Electronics - Microelectronics, Wafer-scale integration