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Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

final report

By Fred H. Pollak

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Publish Date

1990

Publisher

National Aeronautics and Space Administration,National Technical Information Service, distributor

Language

eng

Pages

-