Tomeki

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

final report

By Fred H. Pollak

0 (0 Ratings)
0 Want to read0 Currently reading0 Have read

Publish Date

1990

Publisher

National Aeronautics and Space Administration,National Technical Information Service, distributor

Language

eng

Pages

-

1-2 of 2 Editions

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

View Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions
Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditionsfinal report

Language: eng

Published In: 1990

Publisher: National Aeronautics and Space Administration, National Technical Information Service, distributor

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

View Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions
Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditionsfinal report

Language: eng

Published In: 1990

Publisher: National Aeronautics and Space Administration, National Technical Information Service, distributor