Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions
An edition of Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions (1990)
final report
By Fred H. Pollak
Publish Date
1990
Publisher
National Aeronautics and Space Administration,National Technical Information Service, distributor
Language
eng
Pages
-